Composite Layering Posterior Measure Silicon

6 046,00 Ft 27% VAT included

Composite Layering Posterior Measure Silicon

Description

Composite Layering Posterior Measure Silicon ? Lavender. Double Ended. Posterior version of the measure instrument. Designed for horizontal and vertical measuring of ?thickness of composite layers on posterior restorations. The fork shaped tip of the instrument allows measuring and modelling of the composite wall with the presence of a matrix. Manufactured with silicon handles, French points and non-stick coating.

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